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Abstract

Power supply reliability has always been an important issue that receives special attention from all countries. The highly reliable power supply system has a significant impact on the sustainable development of the country’s economy. To improve reliability, particularly improving the reliability indices of SAIDI/SAIFI, one of the most effective solutions currently being applied is “Automation”. The Fault Location, Isolation and Service Restoration function (FLISR) of the Distribution Automation System (DAS) support the electrical grid to have optimal fault solving ability, which not only improves operational efficiency but also enhances the quality of power supply. However, the recent remaining problem on the Ho Chi Minh City (HCMC) electricity grid is the non–selective protection of protection devices (breaker, recloser), therefore, the simultaneous trip fault occurs regularly. In particular, the algorithms in centralized automation software are unable to detect and handle this fault type. Therefore, it is very necessary to research and propose some effective methods to solve this matter, especially in the context that HCMC is accelerating the automation process of the current distribution grid. Besides, to demonstrate the effectiveness of these proposed methods, the study also shows some simulation and reality pilot



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Article Details

Issue: Vol 5 No 4 (2022)
Page No.: 1719-1736
Published: Mar 20, 2023
Section: Research article
DOI: https://doi.org/10.32508/stdjet.v5i4.1021

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Copyright: The Authors. This is an open access article distributed under the terms of the Creative Commons Attribution License CC-BY 4.0., which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.

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 How to Cite
Nguyễn, T., Huỳnh, Đạt, Lê, M., Nguyễn, D., Phan, D., & Lê, B. (2023). Research of Solutions to limit simultaneous trip fault to effectively operate the Distribution Automation System in Ho Chi Minh city. VNUHCM Journal of Engineering and Technology, 5(4), 1719-1736. https://doi.org/https://doi.org/10.32508/stdjet.v5i4.1021

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